Volume 32, No. 63.
January-March 2023 (Continuous Publication)

Table of contents

1. Digital Image Representation Model Enriched with Semantic Web Technologies: Visual and Non-Visual Information

   Sandra-Milena Roa-Martínez, Caio Coneglian, Silvana Vidotti

   e14815

   • Abstract 358
     
   • PDF 385
     
   • XML 6
     

   PDF XML

2. OntoCaimer: Towards an Ontological Model to Support the Care of Patients with Alzheimer's Disease

   Laura-Daniela Lasso-Arciniegas, César-Jesús Pardo-Calvache, Raúl Mazo

   e15170

   • Abstract 322
     
   • PDF 261
     
   • XML 3
     

   PDF XML

3. Systematic Mapping of the Literature on Smells in Software Development Requirements

   Mayra-Alejandra Castillo-Motta, Rubén-Darío Dorado-Córdoba, César-Jesús Pardo-Calvache, Carlos-Eduardo Orozco-Garcés

   e15233

   • Abstract 419
     
   • PDF 362
     
   • XML 6
     

   PDF XML

4. Methodology to Prepare Patent Analysis and the Technological Maturity Cycle

   Santiago Sinisterra, Ruben Camargo-Amado, Diego Triviño, Fiderman Machuca-Martínez

   e14299

   • Abstract 342
     
   • PDF 173
     
   • XML 22
     

   PDF XML

5. IoT-ATL: Prototype of a Digital Twin to Simulate Educational Scenarios in the Art and Technology Laboratories at the Departmental Institute of Fine Arts in Cali, Colombia

   Oswaldo-Andrés Ordóñez-Bolaños, Luz-Marina Sierra-Martinez, Diego-Hernán Peluffo-Ordoñez

   e15245

   • Abstract 787
     
   • PDF 512
     
   • XML 5
     

   PDF XML

6. Initialization and Local Search Methods Applied to the Set Covering Problem: A Systematic Mapping

   Nelson-Enrique Quemá-Taimbud, Martha-Eliana Mendoza-Becerra, Oscar-Fernando Bedoya-Leyva

   e15235

   • Abstract 385
     
   • PDF 248
     
   • XML 3
     

   PDF XML

7. Automatic Extractive Single Document Summarization: A Systematic Mapping

   Juan-David Yip-Herrera, Martha-Eliana Mendoza-Becerra, Francisco-Javier Rodríguez

   e15232

   • Abstract 299
     
   • PDF 215
     
   • XML 15
     

   PDF XML

8. Rock Wedge Stability Analysis by a Level III Reliability Method

   Rodrigo Hernandez-Carrillo, Gloria-Inés Beltrán-Calvo

   e14768

   • Abstract 300
     
   • PDF 328
     
   • XML 1
     

   PDF XML